High-Electron-Mobility AlGaN/GaN Transistors (HEMTs) for Fluid Monitoring Applications

R. Neuberger, G. M�ller, O. Ambacher, M. Stutzmann

physica status solidi (a) · 2001 · 129 citations · 8 references

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Abstract

High-electron-mobility transistors (HEMTs) based on AlGaN/GaN heterostructures were successfully tested as chemically sensing devices. Exposing the unprotected polar GaN surface in the gate area of a HEMT to liquids of different polarity, milliampere changes in the source–drain current could be detected. These sensing effects are likely to arise from chemical interactions with a sheet of ionic charge on the free GaN surface which compensates the electronic charge of a two-dimensional electron gas at a subsurface AlGaN/GaN interface.

References

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