Publication | Closed Access
High-Electron-Mobility AlGaN/GaN Transistors (HEMTs) for Fluid Monitoring Applications
128
Citations
8
References
2001
Year
Wide-bandgap SemiconductorElectrical EngineeringElectronic DevicesDifferent PolarityEngineeringSemiconductor DeviceSurface ScienceApplied PhysicsAluminum Gallium NitrideHigh-electron-mobility TransistorsGan Power DeviceFluid Monitoring ApplicationsCategoryiii-v SemiconductorIonic Charge
High-electron-mobility transistors (HEMTs) based on AlGaN/GaN heterostructures were successfully tested as chemically sensing devices. Exposing the unprotected polar GaN surface in the gate area of a HEMT to liquids of different polarity, milliampere changes in the source–drain current could be detected. These sensing effects are likely to arise from chemical interactions with a sheet of ionic charge on the free GaN surface which compensates the electronic charge of a two-dimensional electron gas at a subsurface AlGaN/GaN interface.
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