Applied Optics · 1991 · 134 citations · 6 references
Natural SciencesElectrical EngineeringPhysicsOpticsOptoelectronicsPhotonicsFiber OpticsFourier OpticsInterferometryOptical InstrumentationOptical InstrumentsOptical MetrologyFrequency Domain ProcessingInterferometric MeasurementInterferometric MetrologyLow-coherence InterferometryMichelson InterferometerOptical Displacement MeasurementOptical InterferometryPrecision
We describe a method for measuring submicrometer distances with an asymmetric fiber Michelson interferometer having an LED as a source of radiation. By measuring the phase slope of the Fourier components in the frequency domain, it is possible to locate the position of reflections with nanometer precision even in the presence of sample dispersion. The method is compatible with time domain sampling at the Nyquist rate which assures efficiency in data acquisition and processing.
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White-Light Interferometric Thickness Gauge
P. A. Flournoy, R. W. McClure, Geert Wyntjes · Applied Optics · 1972 · 163 citations
Natural Sciences, Materials Engineering, Materials Science +16
Interferometric fibre-optic sensor using a short-coherence-length source
Awad S. Gerges, Faramarz Farahi, T.P. Newson et al. · Electronics Letters · 1987 · 30 citations