Statistics
Publications
1
Citations
163
H-Index
1
Active since
1972
Affiliations
DuPont (United States)(Current)
R. W. McClure is an author at DuPont (United States) specializing in interferometry, film thickness measurement, and optical thin films.
Publications per year
1972–1972
1
1
White-Light Interferometric Thickness Gauge
P. A. Flournoy, R. W. McClure, Geert Wyntjes · Applied Optics · 1972 · 163 citations
Natural Sciences, Materials Engineering, Materials Science +16
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