Crystallinity Analysis of Amorphous-Crystalline Mixed Phase Silicon films Using Exafs Method - Concepedia

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Crystallinity Analysis of Amorphous-Crystalline Mixed Phase Silicon films Using Exafs Method

16

Citations

6

References

1992

Year

Masatoshi Wakagi, Toshiki Kaneko, Kiyoshi Ogata, A. Nakano

MRS Proceedings

Materials ScienceExafs MethodMaterial AnalysisEngineeringSilicon On InsulatorApplied PhysicsCrystallinity AnalysisThin FilmsAmorphous SolidThin Film Processing

References

	Year	Citations

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