Angular dependent photoelectric yield and optical constants of Al between 40 and 600 eV

Optical constants from the far infrared to the x-ray region: Mg, Al, Cu, Ag, Au, Bi, C, and Al_2O_3

H.‐J. Hagemann, W. Gudat, C. Kunz · Journal of the Optical Society of America · 1975 · 871 citations

X-ray Crystallography, X-ray Region, Optical Materials +13

Self-consistency and sum-rule tests in the Kramers-Kronig analysis of optical data: Applications to aluminum

E. Shiles, Taizo Sasaki, Mitio Inokuti et al. · Physical review. B, Condensed matter · 1980 · 416 citations

Optical Materials, Engineering, Measurement +21

Optical Analysis of Photoemission

Stephen V. Pepper · Journal of the Optical Society of America · 1970 · 83 citations

Electrical Engineering, Optical Materials, Engineering +15

Attenuation Length for Photoelectrons Excited in Aluminum by 21.2-eV Photons

T.F. Gesell, E. T. Arakawa · Physical Review Letters · 1971 · 36 citations

Aluminium Nitride, Optical Materials, Engineering +16

A new VUV-reflectometer for UHV-applications

H. Hogrefe, D. Giesenberg, R.‐P. Haelbich et al. · Nuclear Instruments and Methods in Physics Research · 1983 · 28 citations

Engineering, Calibration, Optical Properties +3