Attenuation Length for Photoelectrons Excited in Aluminum by 21.2-eV Photons

Abstract

The attenuation length $l$ for photoelectrons excited in aluminum by 584-\AA{} photons has been determined and found to lie in the range $4<~l<~12.8$ \AA{}. The determination was made by analyzing the relative photoemissive yield as a function of angle. The method also provides an accurate means of obtaining the film thickness and index of refraction of aluminum from photoemission measurements alone.