R. Wolf

Angular dependent photoelectric yield and optical constants of Al between 40 and 600 eV

H.-G. Birken, W. Jark, C. Kunz et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 1986 · 22 citations

Materials Science, Aluminium Nitride, Photoelectric Sensor +7

Characteristics And Applications Of Semiconductor Photodiodes From The Visible To The X-Ray Region

J. Barth, E. Tegeler, M. Krisch et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1986 · 18 citations

Semiconductor Photodiodes, Engineering, Gaasp Schottky Photodiode +18

Correlation between morphology, optical losses and laser damage of MgF2−SiO2 multilayers

E. Welsch, H. Walther, D. Schäfer et al. · Thin Solid Films · 1988 · 18 citations

Materials Science, Optical Losses, Optical Materials +11

Investigations on the consistency of optical constants in the XUV determined by different methods

H.-G. Birken, C. Blessing, C. Kunz et al. · Review of Scientific Instruments · 1989 · 15 citations

Optical Materials, Engineering, Optical Testing +19

Measurement of boron and phosphorus concentration in silicon by low-temperature FTIR spectroscopy

M. Porrini, M.G. Pretto, R. Scala et al. · Applied Physics A · 2004 · 13 citations

Low-temperature Ftir Spectroscopy, Boron Nitride, Engineering +8