IEEE Electron Device Letters · 1994 · 21 citations · 7 references
EngineeringElectrical EngineeringMaterials ScienceElectronic MaterialsSemiconductor DevicesSemiconductor MaterialsDetector TechnologyInfrared DetectorsOptical DetectorsOptical Properties Of SemiconductorsPhotodetectorsSemiconductor DetectorsDetector Response ModelingFermi LevelPhotodetector DetectivityPhotoresponse CharacterizationSilicon Infrared DetectorsSilicon PhotodetectorsSilicon Photodiodes
A photoresponse model has been developed for the Si <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">1</sub> spl minus/x/Ge/sub x//Si heterojunction internal photoemission (HIP) infrared detector at wavelengths corresponding to photon energies less than the Fermi energy. A Si/sub 0.7/Ge/sub 0.3//Si HIP detector with a cutoff wavelength of 23 μm and an emission coefficient of 0.4 eV/sup /spl minus/1/ has been demonstrated. The model agrees with the measured detector response at /spl lambda/>8 μm. The potential barrier determined by the model is in close agreement (difference /spl sim/4 meV) with the potential barrier determined by the Richardson plot, compared to the discrepancies of 20-50 meV usually observed for PtSi Schottky detectors.
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Simple Model for Internal Photoemission
Vikram L. Dalal · Journal of Applied Physics · 1971 · 92 citations