Journal of Physics Condensed Matter · 2011 · 24 citations · 9 references
Natural SciencesMaterials EngineeringMaterials ScienceCeramic MaterialsElectronic MaterialsMaterials ChemistryOptoelectronic MaterialsOxide SemiconductorsPerovskite MaterialsSurface PhysicsInterfacial Transport PropertiesLaser FluenceOxide Electronic StructureOxide Host MaterialsPulsed Laser DepositionRare-earth OxidesTransport In HeterostructuresX-ray Diffraction Analysis
We show the influence of pulsed laser deposition fluence on the transport properties of the LaAlO(3)/SrTiO(3) (LAO/STO) heterointerface. Structural characterization by x-ray diffraction and medium energy ion spectrometry enables us to deduce that the electronic behaviour is extremely sensitive to the stoichiometry of the LAO layer as well as the structural quality of the STO surface. An optimum balance of these two quantities is demonstrated for an intermediate laser fluence.
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A high-mobility electron gas at the LaAlO3/SrTiO3 heterointerface
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