Local thickness measurement through scattering contrast and electron energy-loss spectroscopy

Electron Microscopy of Thin Crystals

Nature · 1963 · 4K citations

Natural Sciences, Materials Science, Physics +10

<i>Electron Energy-Loss Spectroscopy in the Electron Microscope</i>

R.F. Egerton, Dale E. Newbury · Physics Today · 1987 · 3.4K citations

Natural Sciences, Physics, Analytical Chemistry +11

Electron microscopy of thin crystals

M.E. Haine · Vacuum · 1966 · 2.4K citations

Natural Sciences, Materials Science, Physics +10

Spectrochemical analysis

Ralph E. Sturgeon · Spectrochimica Acta Part B Atomic Spectroscopy · 1988 · 982 citations

EELS log‐ratio technique for specimen‐thickness measurement in the TEM

T. Malis, Shangcong Cheng, R.F. Egerton · Journal of Electron Microscopy Technique · 1988 · 899 citations

Natural Sciences, Materials Engineering, Materials Science +11