Proceedings of the Physical Society · 1948 · 736 citations · 8 references
Natural SciencesMaterials SciencePhysicsOpticsSpectroscopic AnalysisSpectroscopyDiffractionFourier AnalysisFourier OpticsX-ray CrystallographyX-ray Data AnalysisX-ray DiffractionDiffraction Data ProcessingFourier Optics AnalysisFourier Series AnalysisPowder Diffraction AnalysisPowder X-ray DiffractionSpectrum AnalysisX-ray Diffraction AnalysisX-ray Spectral Analysis
A method is derived, using Fourier analysis, for finding the corrected distribution of intensity across an x-ray diffraction line, and the procedure is illustrated by a numerical example. The method may also be of use in spectrum analysis and statistical problems.
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Particle Size Determination from X-Ray Line Broadening
L. S. Birks, H. Friedman · Journal of Applied Physics · 1946 · 509 citations