Delamination in patterned films

Elastic Fracture Mechanics Concepts for Interfacial Cracks

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Plane Problems of Cracks in Dissimilar Media

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Full copper wiring in a sub-0.25 μm CMOS ULSI technology

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A method for calculating stress intensities in bimaterial fracture

P. P. L. Matos, Robert M. McMeeking, Panos G. Charalambides et al. · International Journal of Fracture · 1989 · 279 citations

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Cracks on bimaterial interfaces: elasticity and plasticity aspects

C.F. Shih · Materials Science and Engineering A · 1991 · 197 citations

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