Holographic interferometry using anisotropic self-diffraction in Bi_12SiO_20

Abstract

Anisotropic self-diffraction in photorefractive Bi(12)SiO(20) crystals is applied to the investigation of dynamic holographic recording through the diffusion process. Specific attention is paid to optimization of experimental parameters for real-time holographic interferometry. The resultant interferometer is applied to obtain both timeaverage and double-exposure interferograms of vibrating and displaced structures.