Real-time double-exposure interferometry with Bi_12SiO_20 crystals in transverse electrooptic configuration

Abstract

Get PDF Email Share Share with Facebook Tweet This Post on reddit Share with LinkedIn Add to CiteULike Add to Mendeley Add to BibSonomy Get Citation Copy Citation Text J. P. Huignard and J. P. Herriau, "Real-time double-exposure interferometry with Bi12SiO20 crystals in transverse electrooptic configuration," Appl. Opt. 16, 1807-1809 (1977) Export Citation BibTex Endnote (RIS) HTML Plain Text Citation alert Save article