Publication | Closed Access
Luminescences from localized states in InGaN epilayers
405
Citations
29
References
1997
Year
Optical MaterialsEngineeringLocalized Excited StateIngan EpilayersImpurity-doped InganPotential MinimaLuminescence PropertyOptical PropertiesCompound SemiconductorPhotonicsElectrical EngineeringPhotoluminescencePhysicsCategoryiii-v SemiconductorSolid-state LightingNatural SciencesSpectroscopyApplied PhysicsUndoped Inxga1−xnOptoelectronics
Optical spectra of the bulk three-dimensional InGaN alloys were measured using the commercially available light-emitting diode devices and their wafers. The emission from undoped InxGa1−xN(x<0.1) was assigned to the recombination of excitons localized at the potential minima originating from the large compositional fluctuation. The emission from heavily impurity-doped InGaN was also pointed out related to the localized states.
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