Applied Physics Letters · 1997 · 405 citations · 29 references
EngineeringMaterials EngineeringMaterials ScienceOptoelectronicsSemiconductor DevicesSemiconductor MaterialsLight-emitting DiodesLuminescent MaterialsOptical Properties Of SemiconductorsOptical Properties Of SolidsOptoelectronic DevicesOptoelectronic MaterialsDefect-related LuminescenceLight-emitting DevicesLight-emitting Diode MaterialsLocal Energy MinimaLuminescence MechanismsSemiconductor Light-emitting Materials
Optical spectra of the bulk three-dimensional InGaN alloys were measured using the commercially available light-emitting diode devices and their wafers. The emission from undoped InxGa1−xN(x<0.1) was assigned to the recombination of excitons localized at the potential minima originating from the large compositional fluctuation. The emission from heavily impurity-doped InGaN was also pointed out related to the localized states.
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InGaN-Based Multi-Quantum-Well-Structure Laser Diodes
Shuji Nakamura, Masayuki Senoh, Shin‐ichi Nagahama et al. · Japanese Journal of Applied Physics · 1996 · 2.5K citations