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Planar-doped barriers in GaAs by molecular beam epitaxy
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1980
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Electrical EngineeringEngineeringRf SemiconductorPhysicsBarrier HeightNanoelectronicsPlanar-doped BarriersApplied PhysicsMolecular Beam EpitaxyNew Majority CarrierMicroelectronicsOptoelectronicsCompound SemiconductorSemiconductor Device
A new majority carrier rectifying device is demonstrated which is made in gallium arsenide by molecular beam epitaxy. It exhibits thermionic transport with positive and negative bias and the barrier height and degree of asymmetry in the I/V characteristic can be continuously varied. The device also shows a constant capacitance with bias.