Journal of Applied Crystallography · 1997 · 51 citations · 0 references
Natural SciencesMaterials EngineeringMaterials ScienceCrystal StructureMaterials CharacterizationMaterials ChemistryCrystallographyDiffractionX-ray CrystallographyX-ray Data AnalysisX-ray DiffractionX-ray SpectroscopyDiffraction Data CollectionHigh-resolution X-ray DiffractionSynchrotron CrystallographySynchrotron DiffractionSynchrotron X-ray CrystallographySynchrotron X-ray DiffractionWide-angle X-ray ScatteringX-ray Diffraction Analysis
Wide-angle X-ray diffraction patterns of single spider-silk fibres of ≤ 5 μm diameter can be obtained at a third-generation synchrotron-radiation source in a few seconds per pattern. This is sufficient to observe the strongest equatorial and first layer line reflections. For higher-resolution structural work, data have to be recorded with cryocooling techniques in order to maintain the crystallinity of the sample for several minutes.