Transferability of Phase Shifts in Extended X-Ray Absorption Fine Structure

Abstract

Phase shifts in extended x-ray-absorption fine-structure (EXAFS) measurements have been empirically determined for atom pairs. For photoelectron energies > 100 eV it is shown that these phase shifts, because they are essentially independent of chemical environment, can be used with EXAFS spectra to determine interatomic distances typically to accuracies of 0.02 \AA{}.