New Technique for Investigating Noncrystalline Structures: Fourier Analysis of the Extended X-Ray—Absorption Fine Structure

Abstract

We have applied Fourier analysis to our point-scattering theory of x-ray absorption fine structure to invert experimental data formally into a radial structure function with determinable structural parameters of distance from the absorbing atom, number of atoms, and widths of coordination shells. The technique is illustrated with a comparison of evaporated and crystalline Ge. We find that the first and second neighbors in amorphous Ge are at the crystalline distance within the accuracy of measurement (1%).