Optical characterisation of porous silicon layers by spectrometric ellipsometry in the 1.5–5 eV range

Silicon quantum wire array fabrication by electrochemical and chemical dissolution of wafers

Leigh Canham · Applied Physics Letters · 1990 · 8K citations

Engineering, Materials Engineering, Materials Science +17

<i>Ellipsometry and Polarized Light</i>

R. M. A. Azzam, N. M. Bashara, Stanley S. Ballard · Physics Today · 1978 · 4.3K citations

Natural Sciences, Physics, Optics +13

Dielectric functions and optical parameters of Si, Ge, GaP, GaAs, GaSb, InP, InAs, and InSb from 1.5 to 6.0 eV

D. E. Aspnes, A. A. Studna · Physical review. B, Condensed matter · 1983 · 4K citations

Natural Sciences, Materials Engineering, Materials Science +17

Visible light emission due to quantum size effects in highly porous crystalline silicon

A.G. Cullis, Leigh Canham · Nature · 1991 · 1.4K citations

Natural Sciences, Materials Science, Physics +16

Ellipsometry and Polarized Light

J.P.G. Farr · Surface Technology · 1978 · 1.1K citations

Natural Sciences, Mathematics, Physics +9