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Temperature-dependent characteristics of Pt Schottky contacts on n-type ZnO
90
Citations
33
References
2004
Year
Materials ScienceElectrical EngineeringSchottky Barrier HeightEngineeringMaterial AnalysisBarrier HeightOxide ElectronicsSurface ScienceApplied PhysicsThin Film Process TechnologyThin FilmsPulsed Laser DepositionPt Schottky ContactsThin Film ZnoThin Film Processing
The Schottky barrier height of Pt contacts on n-type (n∼1016 cm−3) thin film ZnO deposited by pulsed laser deposition was obtained from current–voltage measurements as a function of temperature. The resulting values ranged from 0.61±0.04 eV at 25 °C to 0.46±0.06 eV at 100 °C with saturation current densities of 1.5×10−4 A cm−2 (25 °C) to 6.0×10−2 A cm−2 (100 °C), respectively. The reverse current magnitude was larger than predicted by thermionic emission alone. The measured barrier height for Pt on ZnO is similar to the value reported for both Au and Ag rectifying contacts on this material.
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