Positive Bias Temperature Instability in nMOSFETs with ultra-thin Hf-silicate gate dielectrics - Concepedia

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Positive Bias Temperature Instability in nMOSFETs with ultra-thin Hf-silicate gate dielectrics

42

Citations

6

References

2005

Year

Felice Crupi, C. Nick Pace, G. Cocorullo, G. Groeseneken, M. Aoulaiche, Michel Houssa

Microelectronic Engineering

Electrical EngineeringEngineeringNanoelectronicsBias Temperature InstabilityApplied PhysicsSilicon On InsulatorMicroelectronicsSemiconductor Device

References

	Year	Citations

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