Thermal degradation of low temperature poly-Si TFT

Standardized Terminology for Oxide Charges Associated with Thermally Oxidized Silicon

Bruce E. Deal · Journal of The Electrochemical Society · 1980 · 62 citations

Natural Sciences, Electrical Engineering, Materials Science +15

Coupling algorithms for mixed-level circuit and device simulation

Kartikeya Mayaram, D.O. Pederson · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1992 · 53 citations

Engineering, Computer Engineering, Electrical Engineering +14

Hot Carrier Effects in Low-Temperature Polysilicon Thin-Film Transistors

Yukiharu Uraoka, Tomoaki Hatayama, Takashi Fuyuki et al. · Japanese Journal of Applied Physics · 2001 · 50 citations

Engineering, Electrical Engineering, Materials Science +17

Study of Degradation Phenomenon Due to a Combination of Contamination and Self-Heating in Poly-Si Thin Film Transistors Fabricated by a Low-Temperature Process

Satoshi Inoue, Satoshi Takenaka, Tatsuya Shimoda · Japanese Journal of Applied Physics · 2003 · 23 citations

Engineering, Electrical Engineering, Materials Science +17

Analysis of threshold voltage shift caused by bias stress in low temperature poly-Si TFTs

Satoshi Inoue, Hiroyuki Ohshima, Tatsuya Shimoda · 2002 · 20 citations

Engineering, Electrical Engineering, Materials Science +17