Bruce E. Deal - Concepedia

Author

Bruce E. Deal

Fairchild Semiconductor (United States)

Also Known As

BRUCE E. DEAL, Bruce E. DEAL, Bruce E. Deal

Publications

2.8K

Citations

H-Index

Concepts

All Affiliations

Fairchild Semiconductor (United States)United States Department of the Army

About

Bruce E. Deal is an author at Fairchild Semiconductor (United States) specializing in engineering, applied physics, and materials science.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	13	14	2.2K
2	Applied Physics	13	13	2.1K
3	Chemical Engineering	6	6	414
4	Electrical Engineering	6	6	950
5	Chemistry	4	4	228

Bruce E. Deal

Publications

2.2K

Citations

H-Index

Page 1

	Year	Citations
Interface states and electron spin resonance centers in thermally oxidized (111) and (100) silicon wafers Edward H. Poindexter, P. J. Caplan, Bruce E. Deal, Journal of Applied Physics EngineeringIntegrated CircuitsSilicon On InsulatorSemiconductor DeviceSemiconductors	1981	555
ESR centers, interface states, and oxide fixed charge in thermally oxidized silicon wafers P. J. Caplan, Edward H. Poindexter, Bruce E. Deal, Journal of Applied Physics EngineeringSilicon On InsulatorSemiconductor DeviceEsr CentersSemiconductors	1979	462
The Current Understanding of Charges in the Thermally Oxidized Silicon Structure Bruce E. Deal Journal of The Electrochemical Society Materials EngineeringElectrical EngineeringEngineeringPhysicsNanoelectronics	1974	360
Dependence of Interface State Density on Silicon Thermal Oxidation Process Variables R. R. Razouk, Bruce E. Deal Journal of The Electrochemical Society EngineeringOxidation ResistanceThermal OxidationSilicon On InsulatorThermal Oxidation Variables	1979	238
The Oxidation of Silicon in Dry Oxygen, Wet Oxygen, and Steam Bruce E. Deal Journal of The Electrochemical Society Materials ScienceChemical EngineeringEngineeringOxidation ResistanceSingle Crystal	1963	120
High Pressure Oxidation of Silicon in Dry Oxygen Liang N. Lie, R. R. Razouk, Bruce E. Deal Journal of The Electrochemical Society Materials ScienceChemical EngineeringElectronic DevicesEngineeringOxide Charges	1982	108
Thermal Oxidation Kinetics of Silicon in Pyrogenic H 2 O and 5% HCl / H 2 O Mixtures Bruce E. Deal Journal of The Electrochemical Society Materials ScienceChemical EngineeringEngineeringPyrogenic H 2Oxidation Resistance	1978	81
Kinetics of High Pressure Oxidation of Silicon in Pyrogenic Steam R. R. Razouk, Liang N. Lie, Bruce E. Deal Journal of The Electrochemical Society Materials ScienceChemical EngineeringEffective Trap DensitiesEngineeringOxidation Resistance	1981	78
Standardized Terminology for Oxide Charges Associated with Thermally Oxidized Silicon Bruce E. Deal Journal of The Electrochemical Society Materials ScienceSemiconductorsElectrical EngineeringEngineeringOxide Charges	1980	62
Hydrogen Anneal Effects on Metal‐Semiconductor Work Function Difference R. R. Razouk, Bruce E. Deal Journal of The Electrochemical Society SemiconductorsMaterials ScienceElectrical EngineeringSemiconductor TechnologyEngineering	1982	28

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