Publication | Closed Access

Sampling depth of total electron and fluorescence measurements in Si L- and K-edge absorption spectroscopy

EngineeringPhysicsAtomic Emission SpectroscopyOptical PropertiesSpectroscopyNatural SciencesApplied PhysicsElectron SpectroscopyFluorescence MeasurementsTotal ElectronAbsorption SpectroscopyChemistryOptical SpectroscopySi L-Atomic Fluorescence Spectroscopy