Journal of Physics D Applied Physics · 1989 · 68 citations · 11 references
Natural SciencesMaterials EngineeringMaterials ScienceOptical MaterialsOpticsThin FilmsAbsorption SpectroscopyOptical Properties Of SolidsOptical Thin FilmsRefractive IndexThin Film Optical PropertiesThin-film MaterialsOptical CharacterizationOptical ConstantsOptical Properties EstimationOptical Properties Of Amorphous MaterialsOptical Thin Film CharacterizationThin-film Optical CharacterizationWave Envelopes
A method has been proposed for exact calculation of the optical parameters n and k of a thin film on a transparent substrate by simultaneously solving the equations for two of the envelopes of the transmission and reflection spectra. The singularity of the solution and the convergency area are proved, and the influence of the inaccuracies in drawing the envelopes upon the errors made during the calculation of n and k is also investigated. The method is most accurate for the envelopes of the transmission minima and the reflection maxima in the region of strong and medium absorption. The accuracy of other methods which use data from the transmission or reflection envelopes has also been investigated. The present method describes correctly the change of n in the region of medium and strong absorption for an amorphous film with composition Ge28As12S60.
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