Applied Physics Letters · 1993 · 23 citations · 14 references
Materials SciencePhotoluminescenceEngineeringNanoporous MaterialTransmission Electron MicroscopyNanomaterialsNanotechnologyLuminescence EfficiencyApplied PhysicsNanosize Structures ConnectivitySemiconductor Device FabricationPorous SiliconPorous Silicon FilmsNanoscale ScienceOptoelectronicsSilicon On Insulator
Transmission electron microscopy is used to reveal the existence of an interconnected nanosize structure in porous silicon films. The interconnections of this nanostructure determine the photoexcited electron-hole pair separation and consequently the luminescence efficiency of the material. Efficient photoluminescence is obtained from structures which shows no connectivity.
14
Porous silicon formation: A quantum wire effect
V. Lehmann, U. Gösele · Applied Physics Letters · 1991 · 1.8K citations
Porous silicon formation mechanisms
R. L. Smith, Scott D. Collins · Journal of Applied Physics · 1992 · 1.2K citations
Materials Science, Chemical Engineering, Photoluminescence +12