Non-destructive X-ray study of the interphases in Mo/Si and Mo/B4C/Si/B4C multilayers - Concepedia

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Non-destructive X-ray study of the interphases in Mo/Si and Mo/B4C/Si/B4C multilayers

42

Citations

22

References

2006

Year

H. Maury, Philippe Jonnard, Jean André, J. Gautier, Marc Roulliay, F. Bridou, Franck Delmotte, M. F. Ravet, P. Holliger

Thin Solid Films

Materials ScienceEngineeringNon-destructive X-ray StudySurface ScienceApplied PhysicsSemiconductor MaterialMultilayer HeterostructuresSilicon On InsulatorMo/b4c/si/b4c Multilayers

References

	Year	Citations

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