F. Bridou

EUVI: the STEREO-SECCHI extreme ultraviolet imager

J. P. Wuelser, J. R. Lemen, T. D. Tarbell et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2004 · 506 citations

Investigation of thermal annealing effects on microstructural and optical properties of HfO2 thin films

M. Modreanu, Jordi Sancho‐Parramon, Olivier Durand et al. · Applied Surface Science · 2006 · 124 citations

Materials Science, Optical Materials, Engineering +8

Study of normal incidence of three-component multilayer mirrors in the range 20–40 nm

J. Gautier, Franck Delmotte, Marc Roulliay et al. · Applied Optics · 2005 · 79 citations

Optical Materials, Engineering, Optical Testing +18

Development of Al-based multilayer optics for EUV

Evgueni Meltchakov, Christophe Hecquet, Marc Roulliay et al. · Applied Physics A · 2009 · 67 citations

Materials Science, Optical Materials, Engineering +6

Experimental determination of optical constants of MgF2 and AlF3 thin films in the vacuum ultra-violet wavelength region (60–124nm), and its application to optical designs

F. Bridou, Mireille Cuniot-Ponsard, J. M. Desvignes et al. · Optics Communications · 2009 · 43 citations

Materials Science, Optical Materials, Experimental Determination +9