M. F. Ravet - Concepedia

Author

M. F. Ravet

Centre National de la Recherche Scientifique

Also Known As

M F Ravet, M. F Ravet, M. F. Ravet, M.-F. Ravet, M.F. Ravet, M.‐F. Ravet, Marie Francoise Ravet, Marie Françoise Ravet, Ravet-Krill, Marie-Françoise

Publications

660

Citations

H-Index

Concepts

All Affiliations

Centre National de la Recherche Scientifique Laboratoire Charles Fabry Sorbonne Université Université Paris-Sud Saint-Gobain (France)

About

M. F. Ravet is an author at Centre National de la Recherche Scientifique specializing in applied physics, materials science, and engineering.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	11	11	447
2	Applied Physics	11	11	447
3	Materials Science	11	11	447
4	Natural Sciences	3	3	105
5	Materials Engineering	3	3	64

M. F. Ravet

Publications

585

Citations

H-Index

Page 1

	Year	Citations
Investigation of thermal annealing effects on microstructural and optical properties of HfO2 thin films M. Modreanu, Jordi Sancho‐Parramon, Olivier Durand, Applied Surface Science Materials ScienceOptical MaterialsEngineeringOptical PropertiesOxide Electronics	2006	124
Expanded h.c.p. Fe Structure in (0001) Fe/Ru Superlattices M. Maurer, J.C. Ousset, M. F. Ravet, Europhysics Letters (EPL) Materials ScienceMagnetismMagnetic PropertiesFerromagnetismEngineering	1989	67
50-nm x-ray lithography using synchrotron radiation Y. Chen, R. K. Kupka, F. Rousseaux, Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena Materials ScienceEngineeringElectron-beam LithographyPhysicsMicroscopy	1994	60
Longitudinal coherence measurements of a transient collisional x-ray laser R. F. Smith, James Dunn, James Hunter, Optics Letters	2003	43
Non-destructive X-ray study of the interphases in Mo/Si and Mo/B4C/Si/B4C multilayers H. Maury, Philippe Jonnard, Jean André, Thin Solid Films Materials ScienceEngineeringNon-destructive X-ray StudySurface ScienceApplied Physics	2006	42
La/B <sub>4</sub> C small period multilayer interferential mirror for the analysis of boron Jean‐Marc André, Philippe Jonnard, C. Michaelsen, X-Ray Spectrometry	2005	35
Mixed Valence Properties of CeM<sub>2</sub>Si<sub>2</sub> (M Mn, Fe, Co, Ni, Cu) C. Ammarguellat, M. Escorne, A. Mauger, physica status solidi (b)	1987	32
Characteristics and thermal behavior of W/Si multilayers with well-defined interfaces V. Dupuis, M. F. Ravet, C. Tête, Journal of Applied Physics EngineeringLaser ApplicationsLaser MaterialSilicon On InsulatorHigh-power Lasers	1990	29
X-ray mask development based on SiC membrane and W absorber M. Chaker, S. Boily, Y. Diawara, Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena X-ray SpectroscopyEngineeringX-ray Mask TechnologyThin Film Process TechnologyX-ray Mask Development	1992	26
Improvement of the thermal stability of W/C multilayers Zuimin Jiang, V. Dupuis, B. Vidal, Journal of Applied Physics EngineeringW/c MultilayersThin Film Process TechnologyElectronic PackagingThermal Stability	1992	24

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