Summary Abstract: Scanning tunneling microscopy and atomic force microscopy for microtribology

Abstract

Views Icon Views Article contents Figures & tables Video Audio Supplementary Data Peer Review Share Icon Share Twitter Facebook Reddit LinkedIn Tools Icon Tools Reprints and Permissions Cite Icon Cite Search Site Citation R. Kaneko, K. Nonaka, K. Yasuda; Summary Abstract: Scanning tunneling microscopy and atomic force microscopy for microtribology. J. Vac. Sci. Technol. A 1 March 1988; 6 (2): 291–292. https://doi.org/10.1116/1.575428 Download citation file: Ris (Zotero) Reference Manager EasyBib Bookends Mendeley Papers EndNote RefWorks BibTex toolbar search Search Dropdown Menu toolbar search search input Search input auto suggest filter your search All ContentAVS: Science & Technology of Materials Interfaces and ProcessingJournal of Vacuum Science & Technology A Search Advanced Search |Citation Search