Journal of Electronic Materials · 1980 · 13 citations · 13 references
EngineeringMaterials SciencePhysicsElectronic MaterialsRadiation PhysicsSemiconductor DevicesDefects In Electronic MaterialsProton DosimetryRadiation Damage In MaterialsRadiation Transport In MatterSemiconductor DefectsSemiconductor ReliabilityDeep-level DefectsDiffusion LengthDiffusion MeasurementsIrradiation DamageRadiation Defect CharacterizationRadiation DefectsRadiation Effects
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Study of electron traps in <i>n</i>-GaAs grown by molecular beam epitaxy
D. V. Lang, A. Y. Cho, A. C. Gossard et al. · Journal of Applied Physics · 1976 · 203 citations