Electron energy-loss spectroscopy study of metallic Nb and Nb oxides

Runzhe Tao, Ružica Todorović, Jingjing Liu, Randall J. Meyer, Andrew Arnold, Weronika Walkosz, Peter Zapol, Alexander Romanenko, L. D. Cooley, Robert F. Klie

Journal of Applied Physics · 2011 · 41 citations · 16 references

Concepts

Abstract

We present a series of electron energy-loss spectroscopy (EELS) studies on niobium (Nb) and its oxides (NbO, NbO2, and Nb2O5) to develop a reliable method for quantifying the oxidation state in mixed niobium oxide thin films. Our approach utilizes a combination of transmission electron microscopy and EELS experiments with density functional theory calculations to distinguish between metallic niobium and the different niobium oxides. More specifically, the differences in the near-edge fine-structure of the Nb M-edge and O K-edge provide sufficient information to determine the valence state of niobium. Based on these observed changes in the core-loss edges, we propose a linear relationship that correlates the peak positions in the Nb M- and O K-edges with the Nb valence state. The methods developed in this paper are also applied to ultrathin niobium oxide films to examine the effects of low-temperature baking on the films’ oxidation states.

References

16