Composition, annealing and thickness dependence of structural and optical studies on Zn1−xMnxS nanocrystalline semiconductor thin films

Elements of X-ray Diffraction

E. D. T. Atkins · Physics Bulletin · 1978 · 7.1K citations

X-ray Crystallography, X-ray Spectroscopy, Engineering +16

Determination of the thickness and optical constants of amorphous silicon

R. Swanepoel · Journal of Physics E Scientific Instruments · 1983 · 3.9K citations

Optical Materials, Engineering, Optic Design +17

Diluted magnetic semiconductors

J. K. Furdyna · Journal of Applied Physics · 1988 · 3.4K citations

Magnetic Properties, Engineering, Magnetic Materials +17

III. Dislocation densities in some annealed and cold-worked metals from measurements on the X-ray debye-scherrer spectrum

G.K. Williamson, R.E. Smallman · Philosophical magazine · 1956 · 3.1K citations

X-ray Spectroscopy, Engineering, Severe Plastic Deformation +20

Behavior of the Electronic Dielectric Constant in Covalent and Ionic Materials

S. H. Wemple, M. DiDomenico · Physical review. B, Solid state · 1971 · 3K citations

Dielectrics, Optical Materials, Engineering +30