Determination of Si-metal work function differences by MOS capacitance technique

Physics of Semiconductor Devices

Geoffrey Pridham · Electronics and Power · 1970 · 4K citations

Engineering, Electrical Engineering, Physics +12

Surface States and Barrier Height of Metal-Semiconductor Systems

A. Cowley, Simon M. Sze · Journal of Applied Physics · 1965 · 1.4K citations

Engineering, Materials Engineering, Materials Science +17

A quasi-static technique for MOS C-V and surface state measurements

Markus Kühn · Solid-State Electronics · 1970 · 553 citations

Natural Sciences, Materials Science, Physics +13

Interface Barrier Energy Determination from Voltage Dependence of Photoinjected Currents

Roy Powell · Journal of Applied Physics · 1970 · 305 citations

Engineering, Electrical Engineering, Materials Science +17

Barrier energies in metal-silicon dioxide-silicon structures

B. E. Deal, E. H. Snow, Carver Mead · Journal of Physics and Chemistry of Solids · 1966 · 239 citations

Natural Sciences, Materials Science, Physics +10