Relationships between dielectric breakdown resistance and charge transport in alumina materials—Effects of the microstructure

How the trapping of charges can explain the dielectric breakdown performance of alumina ceramics

J. Liébault, J Vallayer, D. Tréheux et al. · Journal of the European Ceramic Society · 2001 · 126 citations

Materials Science, Dielectrics, Engineering +8

Space charge measurement in a dielectric material after irradiation with a 30 kV electron beam: Application to single-crystals oxide trapping properties

B. Vallayer, G. Blaise, D. Tréheux · Review of Scientific Instruments · 1999 · 115 citations

Secondary Electron Microscope, Engineering, Microscopy +19

Secondary electron emission and self-consistent charge transport and storage in bulk insulators: Application to alumina

X. Meyza, C. Guerret-Piécourt, D. Tréheux et al. · Journal of Applied Physics · 2003 · 100 citations

Engineering, Bulk Alumina Samples, Vacuum Device +23

Electrical conductivity of alumina in a radiation field at temperatures up to 700°C

G.P. Pells · Radiation Effects · 1986 · 36 citations

Microstructural origin of the dielectric breakdown strength in alumina: A study by positron lifetime spectroscopy

A. Si Ahmed, J. Kansy, K. Zarbout et al. · Journal of the European Ceramic Society · 2005 · 20 citations

Materials Science, Aluminium Nitride, Engineering +11