D. Tréheux

How the trapping of charges can explain the dielectric breakdown performance of alumina ceramics

J. Liébault, J Vallayer, D. Tréheux et al. · Journal of the European Ceramic Society · 2001 · 127 citations

Natural Sciences, Materials Engineering, Materials Science +12

Study of copper-alumina bonding

C. Béraud, Michel Courbière, C. Esnouf et al. · Journal of Materials Science · 1989 · 120 citations

Natural Sciences, Materials Engineering, Materials Science +12

Space charge measurement in a dielectric material after irradiation with a 30 kV electron beam: Application to single-crystals oxide trapping properties

B. Vallayer, G. Blaise, D. Tréheux · Review of Scientific Instruments · 1999 · 116 citations

Natural Sciences, Materials Engineering, Materials Science +14

Electron beam charging of insulators: A self-consistent flight-drift model

Matthieu Touzin, C. Guerret-Piécourt, D. Juvé et al. · Journal of Applied Physics · 2006 · 114 citations · Full text

Engineering, Electrical Engineering, Physics +17

Secondary electron emission and self-consistent charge transport and storage in bulk insulators: Application to alumina

X. Meyza, C. Guerret-Piécourt, D. Tréheux et al. · Journal of Applied Physics · 2003 · 101 citations · Full text

Engineering, Materials Science, Physics +17