How the trapping of charges can explain the dielectric breakdown performance of alumina ceramics

J. Liébault, J Vallayer, D. Tréheux, +1

Journal of the European Ceramic Society

Materials ScienceDielectricsEngineeringDielectric Breakdown PerformanceAlumina Ceramics +6

Sb-doped GeS<inf>2</inf> as performance and reliability booster in Conductive Bridge RAM

Elisa Vianello, G. Molas, F. Longnos, +19

Materials ScienceSb-doped GesElectrical EngineeringEngineeringElectronic Materials +11

On the impact of Ag doping on performance and reliability of GeS2-based conductive bridge memories

F. Longnos, Elisa Vianello, C. Cagli, +11

Solid-State Electronics

Materials EngineeringElectrical EngineeringEngineeringNanoelectronicsApplied Physics +4

Microstructural origin of the dielectric breakdown strength in alumina: A study by positron lifetime spectroscopy

A. Si Ahmed, J. Kansy, K. Zarbout, +3

Journal of the European Ceramic Society

Materials ScienceAluminium NitrideEngineeringCorrosionPhysic Of Failure +9

Effect of the Active Layer Thickness and Temperature on the Switching Kinetics of GeS₂-Based Conductive Bridge Memories

Giorgio Palma, Elisa Vianello, G. Molas, +10

Japanese Journal of Applied Physics

Electrical EngineeringSemiconductor DeviceEngineeringActive Layer ThicknessPhysics +10

Positron lifetime measurements in sintered alumina

G. Moya, J. Kansy, A. Si Ahmed, +3

physica status solidi (a)

Materials ScienceSintered AluminaAnnihilation ProcessAluminium NitrideEngineering +11

Charge trapping characterization in the thin oxide layer/non‐conductive substrate system

J. Liébault, D. Moya‐Siesse, J. Bernardini, +1

Surface and Interface Analysis

Materials ScienceElectrical EngineeringEngineeringTrapping PropertiesElectron Beam +12

On the impact of Ag doping on performance and reliability of GeS<inf>2</inf>-based Conductive Bridge Memories

Elisa Vianello, C. Cagli, G. Molas, +11

Materials EngineeringMaterials ScienceElectrical EngineeringElectronic DevicesEngineering +13

Advanced measurement techniques of space-charge induced by an electron beam irradiation in thin dielectric layers

J. Liébault, K. Zarbout, G. Moya, +1

Journal of Non-Crystalline Solids

Electrical EngineeringEngineeringRadiation GenerationAdvanced Measurement TechniquesApplied Physics +6