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Microstructures of GaInN/GaInN Superlattices on GaN Substrates
10
Citations
16
References
2010
Year
Materials ScienceWide-bandgap SemiconductorEngineeringMisfit DislocationsPhysicsCrystalline DefectsGainn/gainn SuperlatticesDislocation InteractionApplied PhysicsCondensed Matter PhysicsAluminum Gallium NitrideGan Power DeviceGa0.83in0.17n Single LayerGainn Superlattice Sample
We found different behaviors of misfit dislocations in a Ga0.83In0.17N single layer and in Ga0.83In0.17N/Ga0.93In0.07N superlattices, both on GaN substrates. In the case of the single layer, misfit dislocations were formed at the GaInN/GaN interfaces and extended through the GaInN layer to the surface. In contrast, the misfit dislocations in the superlattices are bent laterally at interfaces between the Ga0.83In0.17N and Ga0.93In0.07N layers. In addition, most of the dislocations do not reach the surface owing to the formation of dislocation loops. As a result, the dislocation density at the surface of the GaInN superlattice sample was 5×107 cm-2.
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