Noise Spectral Density as a Diagnostic Tool for Reliability of p-n Junctions

Semiconductor surface physics

C. Hilsum · Journal of Physics and Chemistry of Solids · 1958 · 616 citations

A statistical model of flicker noise

J. A. Barnes, D.W. Allan · Proceedings of the IEEE · 1966 · 222 citations

Engineering, Electrical Engineering, Vision Science +11

Theory of Shot Noise in Junction Diodes and Junction Transistors

A. Der Ziel · Proceedings of the IRE · 1955 · 122 citations

Engineering, Electrical Engineering, Circuit Theory +16

Electrical Noise In Semiconductors

H. C. Montgomery · Bell System Technical Journal · 1952 · 83 citations

Engineering, Electrical Engineering, Physics +17

Theory and Experiments on Shot Noise in Silicon P-N Junction Diodes and Transistors

B. Schneider, M. O. Strutt · Proceedings of the IRE · 1959 · 59 citations

Engineering, Electrical Engineering, Microelectronics +16