Review of Scientific Instruments · 1989 · 13 citations · 5 references
Natural SciencesMaterials SciencePhysicsCrystal StructureOpticsRadiation MeasurementCrystallographyDiffractionX-ray CrystallographyX-ray Data AnalysisX-ray DiffractionX-ray OpticsDiffraction Data CollectionDiffraction From Crystal PlanesHigh-resolution X-ray DiffractionIntensity AnalysisSingle-crystal DiffractionSingle-crystal SiliconSynchrotron DiffractionSynchrotron X-ray Diffraction
This paper describes the performance of a four-circle diffractometer installed at the Photon Factory for extensive use with synchrotron radiation for various investigations in the field of solid state physics. Its main part is based on a Huber 5020.4 type diffractometer with a crystal analyzer designed for vertical diffraction plane attitude. The diffractometer is mounted on a carriage table, which can precisely adjust the position of the diffractometer with respect to the incident beam monochromatized by successive reflection from a pair of Si(111) crystals. With a perfect crystal used as the analyzer the large size of the ω and 2θ circles enables us to make high resolution (ΔQ/Q∼10−4) measurements of x-ray scattering intensity distribution from a single crystal. The large space in the center of the diffractometer permits us to put a pressurizing cell or a cryostat on the φ table for scattering measurements at controlled pressures and temperatures. Selected examples of the application are presented.
5