Advanced Materials · 2012 · 322 citations · 20 references
Natural SciencesMaterials SciencePhysicsElectronic MaterialsSemiconductor MaterialsThin FilmsAtomic Force MicroscopyCarrier TransportScanning Probe MicroscopySemiconductor InterfacesSemiconductor PhysicsSolar CellsCarrier CollectionConductive Atomic Force MicroscopyGrain BoundariesKelvin Probe Force MicroscopySolar Cell CharacterizationSolar Cell Device PhysicsSurface PotentialThin-film Solar Cells
Scanning Kelvin probe microscopy (SKPM) measurements reveal a higher positive surface potential at the grain boundaries (GBs) as compared to the grain while conductive atomic force microscopy (C-AFM) measurements show higher current flow in the vicinity of the GBs of Cu2ZnSnS4 (CZTS) and Cu2ZnSn(S,Se)4 (CZTSSe). These results demonstrate the enhanced minority carrier collection taking place at the GBs of CZTS and CZTSSe.
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Solar cell efficiency tables (version 54)
Martin A. Green, Ewan D. Dunlop, Dean H. Levi et al. · Progress in Photovoltaics Research and Applications · 2019 · 1.5K citations · Full text