Physical review. B, Solid state · 1970 · 46 citations · 19 references
Natural SciencesMaterials SciencePhysicsCondensed Matter PhysicsMaterials PhysicsSolid State PhysicsElastic DeformationElectron-phonon InteractionsElectronic Band StructureOptical Properties Of SolidsStrain HardeningStress-strain BehaviorConduction BandDeformationPhononsStrain EffectsStrain Effects On Electronic PropertiesUniaxial StrainValence BandValence Band Structure
The splittings and shifts of the phonon-aided indirect exciton edge (${\ensuremath{\Gamma}}_{15}\ensuremath{\rightarrow}{X}_{1}$) of AlSb produced by uniaxial stresses along [001], [111], and [110] have been determined. These measurements were performed at 77\ifmmode^\circ\else\textdegree\fi{}K, using the wavelength-modulation technique. TO-phonon-assisted transitions, not reported previously, have been identified in the spectrum of the stressed materials; they yield a TO-phonon energy at $X$ of 42\ifmmode\pm\else\textpm\fi{}3 meV. These measurements have also yielded the shear deformation potentials of the ${\ensuremath{\Gamma}}_{15}$ valence band ($b=\ensuremath{-}1.35\ifmmode\pm\else\textpm\fi{}0.1$ eV and $d=\ensuremath{-}4.3\ifmmode\pm\else\textpm\fi{}0.4$ eV) and the ${X}_{1}$ conduction band (${\mathcal{E}}_{2}=+5.4\ifmmode\pm\else\textpm\fi{}0.3$ eV). The hydrostatic deformation potential of the indirect edge was found to be ${a}_{i}=+2.2\ifmmode\pm\else\textpm\fi{}0.2$ eV. Electroreflectance measurements at room temperature of the direct edge (${\ensuremath{\Gamma}}_{15}\ensuremath{\rightarrow}{\ensuremath{\Gamma}}_{1c}$) of this material under uniaxial compression along the [110] direction have also been performed. The stress-induced splitting of the ${\ensuremath{\Gamma}}_{15}$ band observed in these measurements agrees with that obtained from the indirect exciton. The hydrostatic coefficient of the direct edge was found to be -5.9\ifmmode\pm\else\textpm\fi{}1.2 eV.
19
Piezo-Electroreflectance in Ge, GaAs, and Si
Fred H. Pollak, M. Cardona · Physical Review · 1968 · 852 citations
Natural Sciences, Materials Engineering, Materials Science +16
Electroreflectance at a Semiconductor-Electrolyte Interface
M. Cardona, K. L. Shaklee, Fred H. Pollak · Physical Review · 1967 · 779 citations
William Dunlap · Solid-State Electronics · 1965 · 321 citations
Thermoreflectance in Semiconductors
E. Matatagui, A. G. Thompson, M. Cardona · Physical Review · 1968 · 283 citations