Bulletin of the Russian Academy of Sciences Physics · 2013 · 16 citations · 12 references
Natural SciencesMaterials ScienceElectromagneticsMaterials CharacterizationSpectroscopyAuger Electron SpectroscopyElectrical CharacterizationElectron Beam PhysicsElectron CountingElectron DosimetryElectron TransportBackscatter AnalysisBackscatter CoefficientBackscatter RadiationBackscatteringExperimental Results InterpretationParticle BackscatteringRadiation Backscatter
Semiempirical relations for the following basic parameters of backscattered electrons in a scanning electron microscope are derived: reflection coefficient; average and most probable energies; energy spectra; and energy of backscattered electrons, depending on the angle of exit. The energy dependence is shown to have a maximum in the angular region of backscattered electrons Θ = 65°–75°.
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