The application of control chart for defects and defect clustering in IC manufacturing based on fuzzy theory - Concepedia

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The application of control chart for defects and defect clustering in IC manufacturing based on fuzzy theory

45

Citations

8

References

2006

Year

Kun‐Lin Hsieh, Lee‐Ing Tong, Min-Chia Wang

Expert Systems with Applications

Fault DiagnosisFuzzy LogicEngineeringReliability EngineeringFuzzy ModelingIndustrial EngineeringComputer EngineeringIc ManufacturingSystems EngineeringFuzzy OptimizationControl ChartFault DetectionFuzzy ClusteringDefect Clustering

References

	Year	Citations

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