Defect Clustering
Defect Clustering is a defect modeling approach that categorizes software defects based on their spatial, temporal, or structural proximity within a system to identify patterns indicative of underlying fault-prone modules or mechanisms.
195
Publications
8.2K
Citations
528
Authors
271
Institutions
Publications per year
2017–2026
37
195
Defect Level as a Function of Fault Coverage
Williams, Brown · IEEE Transactions on Computers · 1981 · 348 citations
Engineering, Computer Engineering, Electrical Engineering +17
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271
IBM (United States)
Armonk, United States
9 h-index
14 publications
837 citations

Oak Ridge National Laboratory
Oak Ridge, United States
7 h-index
13 publications
722 citations

University of Massachusetts Amherst
Amherst Center, United States
7 h-index
11 publications
415 citations
Auburn University
Auburn, United States
6 h-index
6 publications
128 citations
Argonne National Laboratory
Lemont, United States
5 h-index
8 publications
230 citations
University of Tennessee at Knoxville
Knoxville, United States
5 h-index
7 publications
319 citations
Duke University
Durham, United States
5 h-index
8 publications
153 citations
University of California, Berkeley
Berkeley, United States
4 h-index
6 publications
145 citations
1–8 of 271
15 publications · 659 citations
14
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7 publications · 204 citations
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5 publications · 134 citations
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6 publications · 266 citations
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JSS · 3 publications · 194 citations
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