Defect Clustering

Defect Clustering is a defect modeling approach that categorizes software defects based on their spatial, temporal, or structural proximity within a system to identify patterns indicative of underlying fault-prone modules or mechanisms.

195

Publications

8.2K

Citations

528

Authors

271

Institutions

Publications per year

2017–2026

37

Authors

528

  1. AS
    A.D. Singh

    Auburn University, United States

    7 publications · 140 citations

    7

    h-index

  2. CK
    C.M. Krishna

    University of Massachusetts Amherst, United States

    5 publications · 110 citations

    5

    h-index

  3. KC
    Krishnendu Chakrabarty

    Duke University, United States

    5 publications · 87 citations

    5

    h-index

  4. DJ
    David J. Friedman

    Providence Portland Medical Center, United States

    5 publications · 295 citations

    5

    h-index

  5. SJ
    Suk Joo Bae

    Hanyang University, South Korea

    4 publications · 143 citations

    4

    h-index

1–5 of 528

Venues

  1. IEEE Transactions on Semiconductor Manufacturing

    15 publications · 659 citations

    14

    h-index

  2. Journal of Nuclear Materials

    7 publications · 204 citations

    7

    h-index

  3. 5

    h-index

  4. Expert Systems with Applications

    6 publications · 266 citations

    5

    h-index

  5. Journal of Systems and Software

    JSS · 3 publications · 194 citations

    3

    h-index

1–5