Improvement of breakdown and current collapse characteristics of GaN HEMT with a polarization-graded AlGaN buffer

Abstract

A GaN HEMT with a polarization-graded AlGaN buffer is performed by two-dimensional analysis of drift-diffusion simulations. The bulk trap-induced current collapse of the proposed structure is effectively restrained in contrast to that of conventional HEMTs with a GaN or AlGaN buffer, resulting from the fact that the high and flat back-barrier altitude in the proposed structure prevents the two-dimensional electron gas (2DEG) from spilling over from the channel, with the reduction of hot carriers injecting into the buffer followed by trapping in deep acceptor-like levels. Simultaneously, the off-state breakdown voltage is remarkably enhanced, due to the strong electric breakdown field of the polarization-graded AlGaN buffer and the restraint of the buffer leakage current. In addition, the relationship between the off-state breakdown voltage and the thickness of the polarization-graded AlGaN buffer is analyzed.