Material identification of loose particles in sealed electronic devices using PCA and SVM

The Nature of Statistical Learning Theory

Stephan R. Sain, Vladimir Vapnik · Technometrics · 1996 · 4.1K citations

Computing, Computer Science, Mathematics +11

A comparison of methods for multiclass support vector machines

Chih‐Wei Hsu, Chih‐Jen Lin · IEEE Transactions on Neural Networks · 2002 · 643 citations

Computing, Computer Science, Data Mining +15

An approach based on current and sound signals for in-process tool wear monitoring

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Engineering, Manufacturing Engineering, Mechanical Engineering +14

Automatic Decomposition of the Clinical Electromyogram

Kevin C. McGill, Kenneth L. Cummins, Leslie J. Dorfman · IEEE Transactions on Biomedical Engineering · 1985 · 208 citations

Engineering, Bioengineering, Biomedical Engineering +16

Waveform based clustering and classification of AE transients in composite laminates using principal component analysis

Mikael Johnson · NDT & E International · 2002 · 119 citations

Engineering, Materials Engineering, Materials Science +13