Formation of Nanopatterns of a Self-Assembled Monolayer (SAM) within a SAM of Different Molecules Using a Current Sensing Atomic Force Microscope

Abstract

Nanosized patterns of an alkanethiol self-assembled monolayer (SAM) were prepared within a SAM of a different alkanethiol on a gold substrate using a current sensing atomic force microscope (CSAFM). When the conducting tip with a sufficient bias was scanned over a SAM in toluene solution containing an alkanethiol of a different chain length, the original SAM underneath the tip was removed and a new nanospace-confined SAM of the alkanethiol in toluene was formed. The formation of the nanopattern was ascertained by the measurements of the conductivity distribution and current-bias relation by the CSAFM.