Japanese Journal of Applied Physics · 1996 · 11 citations · 24 references
Natural SciencesMaterials EngineeringMaterials ScienceElectronic MaterialsSemiconductor MaterialsThin FilmsEpitaxial GrowthOptical Properties Of SemiconductorsSemiconductor Device MaterialsSemiconductor SurfacesThin Film Optical PropertiesThin-film MaterialsAtomic Layer EpitaxyBand Emission SpectraEpitaxial Film GrowthEpitaxial Growth KineticsEpitaxial MaterialsSubstrate Temperature Effects
ZnS films have been grown on (100)-Si substrate in atomic layer epitaxy (ALE) mode using DMZn and H2S as source materials. The growth rate was 0.7 monolayer per cycle, independent of substrate temperature in the range 125° C to 225° C. Under optimum growth conditions, ZnS layers grown in ALE mode showed good surface morphology. In photoluminescence (PL) spectra, a sharp peak at 337 nm was observed at room temperature, which was attributed to band-to-band emission.
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Coherent Growth of ZnSe on GaAs by MOCVD
Hiroshi Mitsuhashi, Iwao Mitsuishi, M. Mizuta et al. · Japanese Journal of Applied Physics · 1985 · 169 citations